DocumentCode :
1848796
Title :
A functional model for test sequence generation
Author :
Koh, Liang-Seng ; Wang, Chang-Jia ; Liu, Ming T.
fYear :
1994
fDate :
12-15 April 1994
Firstpage :
336
Keywords :
Automata; Contracts; Degradation; Flow graphs; Information science; Protocols; Software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers and Communications, 1994., IEEE 13th Annual International Phoenix Conference on
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-1814-5
Type :
conf
DOI :
10.1109/PCCC.1994.504135
Filename :
504135
Link To Document :
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