Title :
RF materials characterization metrology at NBS/NIST: past and recent work, future directions and challenges
Author :
Baker-Jarvis, James
Author_Institution :
Radio-Frequency Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We summarize the RF materials characterization programs at NBS/NIST. We also project what we believe will be the most important measurement problems for the future
Keywords :
dielectric measurement; magnetic variables measurement; measurement standards; reviews; NBS/NIST; RF materials characterization metrology; measurement problems; review; Conducting materials; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Magnetic materials; Metrology; NIST; Permeability; Permittivity measurement; Radio frequency;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
DOI :
10.1109/CEIDP.2001.963535
