DocumentCode :
1848926
Title :
High voltage and current metrology at NIST. Precision measurements of the past, present, and the future
Author :
FitzPatrick, G.J. ; Simmon, E.D.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2001
fDate :
2001
Firstpage :
277
Lastpage :
280
Abstract :
The accurate measurement of high voltages and currents is vital to monitoring power flows in electric power systems, metering electric power and energy, and, of course, to characterizing the behavior of electrical insulation. NIST has been making precision electrical measurements since its inception a century ago. This paper discusses metrology that is now used or under development at NIST for ac and pulse high voltages and currents. The compensated current comparator is at the heart of most precision ac measurements made at NIST because it offers the greatest sensitivity and lowest measurement uncertainty even today, some forty years after its development. It is used for characterizing ac high voltage and current transformers in terms of their ratio and phase angles, and also for capacitor ratio measurements. Precision ac high voltage dividers with active electronic compensation have also been recently developed. Measurement systems utilizing the magneto-optic Faraday effect are now being developed for both ac and pulsed currents. The basic principles of these devices and systems, their practical limitations, and measurement uncertainties are discussed in this paper
Keywords :
Faraday effect; calibration; capacitors; electric current measurement; measurement uncertainty; potential transformers; voltage dividers; voltage measurement; NIST; ac currents; ac high voltage dividers; ac transformers; active electronic compensation; capacitor ratio measurements; compensated current comparator; high current metrology; high voltage metrology; lowest measurement uncertainty; magneto-optic Faraday effect; phase angles; precision measurements; pulsed currents; ratio; sensitivity; Current measurement; Electric variables measurement; Energy measurement; Measurement uncertainty; Metrology; NIST; Power measurement; Pulse measurements; Pulse transformers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963538
Filename :
963538
Link To Document :
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