DocumentCode :
1849058
Title :
Emerging MOSFET packaging technologies and their thermal evaluation
Author :
Fan, Xuejun ; Haque, Shatil
Author_Institution :
Philips Res. USA, Briarcliff Manor, NY, USA
fYear :
2002
fDate :
2002
Firstpage :
1102
Lastpage :
1108
Abstract :
Major MOSFET manufacturers have recently introduced innovative packaging options to achieve the next level of breakthroughs in electrical and thermal performance. Some of the innovations involve replacement of wire-bonds with solder-bumps for device interconnections in power devices and reduction in number of interfaces/paths for heat dissipation. The overall goal is to achieve small form factor MOSFET packages with significant improvements in electrical and thermal performance. This paper outlines the recent trends in MOSFET packaging and provides package-level thermal modeling results of wire-bond, strap bond, flipchip, ball-grid-array, and micro-lead-frame based packages. It also highlights the critical issues related to the processing, cost and reliability of such packages, which must be addressed before the conventional lead-frame based discrete solutions can be replaced with the new ones. Fundamental cooling mechanisms associated with different packaging technologies for MOSFETs are investigated. The impact of the internal package design on thermal performance is discussed in detail. The role of underfill materials in flip chip and BGA applications is also addressed.
Keywords :
ball grid arrays; cooling; flip-chip devices; lead bonding; multichip modules; power MOSFET; semiconductor device packaging; semiconductor device reliability; thermal management (packaging); thermal resistance; BGA; MOSFET; flip chip; internal package design; micro-lead frame; multichip module; packaging technologies; power packages; strap bond; thermal modeling; thermal performance; underfill materials; wire-bond; Bonding; Cooling; Costs; Flip chip; Lead; MOSFET circuits; Manufacturing; Packaging; Technological innovation; Thermal factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2002. ITHERM 2002. The Eighth Intersociety Conference on
ISSN :
1089-9870
Print_ISBN :
0-7803-7152-6
Type :
conf
DOI :
10.1109/ITHERM.2002.1012581
Filename :
1012581
Link To Document :
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