DocumentCode
1849096
Title
Normality analysis as a radio frequency interference detection
Author
Tarongi, J.M. ; Camps, A.
Author_Institution
Dept. del Teor. del Senyal i Comun., Univ. Politec. de Catalunya, Barcelona, Spain
fYear
2010
fDate
1-4 March 2010
Firstpage
288
Lastpage
293
Abstract
Radio-frequency interference (RFI) present in microwave radiometry measurements leads to erroneous radiometnc results. RFI sources include spurious signals and harmonics from lower frequency bands, spread-spectrum signals overlapping the "protected" band of operation, or out-of-band emissions not properly rejected by the pre-detection filters due to its finite rejection. RFI addition to the radiometnc signal modifies the detected power and the estimated antenna temperature from which the geophysical parameters will be retrieved. In recent years, techniques to detect the presence of RFI m radiometnc measurements have been developed. They include time- and/or frequency-domain analyses, or statistical analysis of the received signal which, in the absence of RFI, must be a zero-mean Gaussian process. The motivation of this paper is the study of a set of normality tests applied to the received signal which will be a combination of a thermal noise signal jointly with a set of RFI signals. In addition, performance of the different normality tests will be compared with the Kurtosis performance as a function of some parameters of the interfering signal to obtain the best solution in each case. A description of every normality test is presented.
Keywords
radiofrequency interference; radiometry; time-frequency analysis; Gaussian process; Kurtosis performance; frequency domain analysis; microwave radiometry measurement; normality analysis; radiofrequency interference detection; spread spectrum signal; time domain analysis; Decision support systems; Detection; Microwave radiometry; Radio Frequency Interference;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Radiometry and Remote Sensing of the Environment (MicroRad), 2010 11th Specialist Meeting on
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-8120-0
Electronic_ISBN
978-1-4244-8121-7
Type
conf
DOI
10.1109/MICRORAD.2010.5559540
Filename
5559540
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