DocumentCode
1849154
Title
Accurate Characterization of Fringing Effects at On-Chip Line Steps
Author
Winkel, Thomas-Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut
Author_Institution
IBM Deutschland Entwicklung GmbH, Germany
Volume
38
fYear
2000
fDate
Nov. 2000
Firstpage
1
Lastpage
7
Abstract
The electrical scattering field at steps on interconnects can be taken into account by a virtual additional line length of the wider line [1]. This effect must be taken into account when characterizing on and off-chip interconnects with discontinuities. The theory will be discussed and measurement results will be presented.
Keywords
Electric variables measurement; Impedance measurement; Laboratories; Length measurement; Microwave measurements; Probes; Propagation constant; Reflection; Scattering parameters; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Fall, 56th
Conference_Location
Boulder, AZ, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.2000.327445
Filename
4120144
Link To Document