Title :
Accurate Characterization of Fringing Effects at On-Chip Line Steps
Author :
Winkel, Thomas-Michael ; Dutta, Lohit Sagar ; Grabinski, Hartmut
Author_Institution :
IBM Deutschland Entwicklung GmbH, Germany
Abstract :
The electrical scattering field at steps on interconnects can be taken into account by a virtual additional line length of the wider line [1]. This effect must be taken into account when characterizing on and off-chip interconnects with discontinuities. The theory will be discussed and measurement results will be presented.
Keywords :
Electric variables measurement; Impedance measurement; Laboratories; Length measurement; Microwave measurements; Probes; Propagation constant; Reflection; Scattering parameters; Semiconductor device measurement;
Conference_Titel :
ARFTG Conference Digest-Fall, 56th
Conference_Location :
Boulder, AZ, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2000.327445
