• DocumentCode
    1849194
  • Title

    New Model Parameter Extraction Environment For The Submicron Circuit Models

  • Author

    Chang-Hoon Choi ; Jin-Kyu Park ; Yeong-Gil Kim ; Kyung-Ho Kim ; Sang-Hoon Lee

  • Author_Institution
    Samsung Electronics
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1535
  • Lastpage
    1538
  • Keywords
    Algorithm design and analysis; Capacitance-voltage characteristics; Circuits; Curve fitting; Data mining; Equations; Inverters; MOSFETs; Parameter extraction; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    IEEE
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • Filename
    692951
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1849194