DocumentCode :
1849194
Title :
New Model Parameter Extraction Environment For The Submicron Circuit Models
Author :
Chang-Hoon Choi ; Jin-Kyu Park ; Yeong-Gil Kim ; Kyung-Ho Kim ; Sang-Hoon Lee
Author_Institution :
Samsung Electronics
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1535
Lastpage :
1538
Keywords :
Algorithm design and analysis; Capacitance-voltage characteristics; Circuits; Curve fitting; Data mining; Equations; Inverters; MOSFETs; Parameter extraction; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
692951
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1849194
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