• DocumentCode
    1849366
  • Title

    Combining all flying microwave radiometers to compute the water vapor path delay for altimeter missions

  • Author

    Stum, Jacques ; Sicard, Philippe ; Carrere, Loren ; Lambin, Juliette

  • Author_Institution
    Collecte Localisation Satellites, Ramonville, France
  • fYear
    2010
  • fDate
    1-4 March 2010
  • Firstpage
    230
  • Lastpage
    235
  • Abstract
    An objective analysis (OA) method is implemented, to compute the altimeter path delay (PD) induced by atmospheric water vapor. Input PD observations are derived from total precipitable water measurements from all currently flying scanning microwave radiometers (AMSU-A, AMSR-E, TMI and SSMI). ECMWF model derived PD is used as first-guess field. Calculation of the statistical variables required by the OA are presented : these include the variance and correlation function of the radiometer path delay minus its first-guess, as well as the observations error variance. The performance of the OA-derived water vapor path delay is assessed, using 4 months of Jason-1 altimeter data. It is shown that the OA-derived PD estimate is more accurate than the ECMWF model derived one, but remains less accurate than the one derived from the Jason microwave radiometer.
  • Keywords
    atmospheric humidity; atmospheric precipitation; radiometry; AMSR-E; AMSU-A; ECMWF model; Jason microwave radiometer; Jason-1 altimeter data; SSMI; TMI; altimeter missions; altimeter path delay; atmospheric water vapor; correlation function; error variance; objective analysis method; radiometer path delay; scanning microwave radiometers; statistical variables; total precipitable water measurements; water vapor path delay; Atmospheric modeling; Correlation; Delay; Microwave measurements; Microwave radiometry; Radiometers; Sea measurements; ECMWF; Water vapor path delay; altimeter; objective analysis; radiometer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Radiometry and Remote Sensing of the Environment (MicroRad), 2010 11th Specialist Meeting on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-8120-0
  • Electronic_ISBN
    978-1-4244-8121-7
  • Type

    conf

  • DOI
    10.1109/MICRORAD.2010.5559554
  • Filename
    5559554