Title :
The next chip challenge: effective methods for viable mixed technology SoCs
Author :
Pogge, H. Bernhard
Author_Institution :
IBM Microelectron., Hopewell Junction, NY, USA
Abstract :
The next generation of computer chips will contain different chip technologies and are termed SoCs (System on a Chip). They present to the process community, the system and circuit communities, as well as to the design and test communities major new challenges. On the other hand they also offer at the same time also new opportunities! For one, the desire to bring more functionality onto a single chip tends to require additional processing, which in turn results in various degrees of device compromises. The chips will also tend to become larger due to the added device content, and this generally will impact the yieldability of the final chip. And such chips will require potentially new approaches to validate the intended design performances. Chip sector reuse must also be brought into the discussion and wherever possible into practice. New SoC methods, starting with the fabrication methodology and extending it into the chip design and test areas, have been set in motion. It is based on a judicious selection of process elements from the traditional chip area and combined with those of a somewhat more recent chip packaging process methodology. This approach results in overcoming simultaneously all of the key current process limitations as experienced with today´s SoC chip designs, as well as eliminates certain chip packaging technology handicaps.
Keywords :
integrated circuit design; integrated circuit packaging; integrated circuit technology; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; system-on-chip; chip packaging process methodology; chip technologies; current process limitations; design performances; mixed technology SoCs; test areas; yieldability; Chip scale packaging; Circuit testing; Costs; Fabrication; Microelectronics; Permission; Semiconductor device packaging; System testing; System-on-a-chip; Wiring;
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Print_ISBN :
1-58113-461-4
DOI :
10.1109/DAC.2002.1012599