EMI conducted emission in differential mode emanating from a SCR: phenomena and noise level prediction

Author

Scheich, R. ; Roudet, J. ; Handel, V.

Author_Institution

Lab. d´´Electrotech. de Grenoble, ENSIEG, St. Martin d´´Heres, France

fYear

1993

fDate

7-11 Mar 1993

Firstpage

815

Lastpage

821

Abstract

An electromagnetic compatibility (EMC) analysis of a power converter is presented. In particular, the phenomena and modeling of conducted noises emission caused by a silicon controlled rectifier (SCR) are described. Theoretical results in the time as well as frequency domain are discussed and compared to the measured time signal and its spectrum

Keywords

electromagnetic compatibility; electromagnetic interference; frequency-domain analysis; power convertors; semiconductor device models; semiconductor device noise; thyristor applications; thyristors; time-domain analysis; EMC; EMI; SCR; conducted noises emission; differential mode; electromagnetic compatibility; frequency domain; modeling; noise level prediction; power converter; silicon controlled rectifier; thyristors; time domain; time signal; Circuit topology; Diodes; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiation; Frequency; Noise level; Rectifiers; Thyristors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Power Electronics Conference and Exposition, 1993. APEC '93. Conference Proceedings 1993., Eighth Annual

Conference_Location

San Diego, CA

Print_ISBN

0-7803-0983-9

Type

conf

DOI

10.1109/APEC.1993.290767

Filename

290767