Title :
Lightwave S-Parameter Measurement Techniques
Author :
Iezekiel, Stavros
Author_Institution :
Institute of Microwaves and Photonics, School of Electronic and Electrical Engineering, The University of Leeds, Leeds LS2 9JT, UK, Email: s.iezekiel@ieee.org
Abstract :
The state-of-the-art in lightwave network analysis is reviewed. Existing commercial instruments use simple architectures which limit the type of calibrations that are available for lightwave S-parameter measurements. However, recent research at The University of Leeds has demonstrated the feasibility of using reversible test sets and modular approaches, which offer the option of full two-port self calibration routines for the first time. Experimental results for the error-corrected S-parameter measurement of optical, optoelectronic and electro-optic two-ports are presented.
Keywords :
High speed optical techniques; Measurement techniques; Microwave frequencies; Microwave photonics; Optical attenuators; Optical devices; Optical fibers; Optical modulation; Optical scattering; Scattering parameters;
Conference_Titel :
ARFTG Conference Digest-Spring, 57th
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2001.327459