DocumentCode
1849575
Title
Lightwave S-Parameter Measurement Techniques
Author
Iezekiel, Stavros
Author_Institution
Institute of Microwaves and Photonics, School of Electronic and Electrical Engineering, The University of Leeds, Leeds LS2 9JT, UK, Email: s.iezekiel@ieee.org
Volume
39
fYear
2001
fDate
37012
Firstpage
1
Lastpage
10
Abstract
The state-of-the-art in lightwave network analysis is reviewed. Existing commercial instruments use simple architectures which limit the type of calibrations that are available for lightwave S-parameter measurements. However, recent research at The University of Leeds has demonstrated the feasibility of using reversible test sets and modular approaches, which offer the option of full two-port self calibration routines for the first time. Experimental results for the error-corrected S-parameter measurement of optical, optoelectronic and electro-optic two-ports are presented.
Keywords
High speed optical techniques; Measurement techniques; Microwave frequencies; Microwave photonics; Optical attenuators; Optical devices; Optical fibers; Optical modulation; Optical scattering; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest-Spring, 57th
Conference_Location
Phoenix, AZ, USA
Print_ISBN
0-7803-5686-1
Type
conf
DOI
10.1109/ARFTG.2001.327459
Filename
4120160
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