• DocumentCode
    1849575
  • Title

    Lightwave S-Parameter Measurement Techniques

  • Author

    Iezekiel, Stavros

  • Author_Institution
    Institute of Microwaves and Photonics, School of Electronic and Electrical Engineering, The University of Leeds, Leeds LS2 9JT, UK, Email: s.iezekiel@ieee.org
  • Volume
    39
  • fYear
    2001
  • fDate
    37012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The state-of-the-art in lightwave network analysis is reviewed. Existing commercial instruments use simple architectures which limit the type of calibrations that are available for lightwave S-parameter measurements. However, recent research at The University of Leeds has demonstrated the feasibility of using reversible test sets and modular approaches, which offer the option of full two-port self calibration routines for the first time. Experimental results for the error-corrected S-parameter measurement of optical, optoelectronic and electro-optic two-ports are presented.
  • Keywords
    High speed optical techniques; Measurement techniques; Microwave frequencies; Microwave photonics; Optical attenuators; Optical devices; Optical fibers; Optical modulation; Optical scattering; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 57th
  • Conference_Location
    Phoenix, AZ, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.2001.327459
  • Filename
    4120160