DocumentCode
184964
Title
An Object Transition Flow Model of Test Data Set for Simulation of RFID Applications
Author
Gihong Kim ; Bonghee Hong
Author_Institution
Dept. of Comput. Eng., Pusan Nat. Univ., Busan, South Korea
fYear
2014
fDate
5-7 Nov. 2014
Firstpage
199
Lastpage
206
Abstract
To evaluate the feasibility of RFID Applications, proper test data sets based on business events should be prepared. There are performance issues in creating a large volume of event data. To solve the performance issues, this paper proposes a novel RFID simulation model based on the concept of new time model. By employing the new time concept, RFID simulation model enables the generated events to be delivered on time and the total generation time to be reduced. To support new RFID simulation model, we also present fast generation algorithms, Merge-sort and Snapshot algorithm. With experimental result, we present the result of performance of two execution algorithms.
Keywords
business data processing; performance evaluation; radiofrequency identification; RFID application simulation model; fast generation algorithms; merge-sort algorithm; object transition flow model; performance issues; snapshot algorithm; test data set; Abstracts; Business; Computational modeling; Data models; Radiofrequency identification; Semantics; Testing; Data Generation; EPCIS Event; RFID; Simulation; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
e-Business Engineering (ICEBE), 2014 IEEE 11th International Conference on
Conference_Location
Guangzhou
Print_ISBN
978-1-4799-6562-5
Type
conf
DOI
10.1109/ICEBE.2014.42
Filename
6982080
Link To Document