• DocumentCode
    184964
  • Title

    An Object Transition Flow Model of Test Data Set for Simulation of RFID Applications

  • Author

    Gihong Kim ; Bonghee Hong

  • Author_Institution
    Dept. of Comput. Eng., Pusan Nat. Univ., Busan, South Korea
  • fYear
    2014
  • fDate
    5-7 Nov. 2014
  • Firstpage
    199
  • Lastpage
    206
  • Abstract
    To evaluate the feasibility of RFID Applications, proper test data sets based on business events should be prepared. There are performance issues in creating a large volume of event data. To solve the performance issues, this paper proposes a novel RFID simulation model based on the concept of new time model. By employing the new time concept, RFID simulation model enables the generated events to be delivered on time and the total generation time to be reduced. To support new RFID simulation model, we also present fast generation algorithms, Merge-sort and Snapshot algorithm. With experimental result, we present the result of performance of two execution algorithms.
  • Keywords
    business data processing; performance evaluation; radiofrequency identification; RFID application simulation model; fast generation algorithms; merge-sort algorithm; object transition flow model; performance issues; snapshot algorithm; test data set; Abstracts; Business; Computational modeling; Data models; Radiofrequency identification; Semantics; Testing; Data Generation; EPCIS Event; RFID; Simulation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    e-Business Engineering (ICEBE), 2014 IEEE 11th International Conference on
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4799-6562-5
  • Type

    conf

  • DOI
    10.1109/ICEBE.2014.42
  • Filename
    6982080