An RF/DSP Test Bed for Baseband Pre-Distortion of RF Power Amplifiers

Author

Woo, Wangmyong ; Ding, Lei ; Kenney, J. Stevenson ; Zhou, G. Tong

Author_Institution

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, 30332-0250, USA, Tel: (404) 385-2303; gte861k@prism.gatech.edu

Volume

39

fYear

2001

fDate

37012

Firstpage

1

Lastpage

7

Abstract

A baseband-to-baseband test bed for characterization of RF power amplifiers and linearization algorithms is proposed. Using this system, algorithms for baseband pre-distortion may be tested in automated fashion, simulating the performance of a real-time DSP processor operating in conjunction with actual RF power amplifier circuits. Full characterization capability to 6 GHz, and up to 6 MHz of baseband bandwidth at 5X oversampling rate is available. The utility of the system is demonstrated with a GaAsFET power amplifier linearized for CDMA use at 1.9 GHz using a lookup table baseband model for amplitude and phase distortion extracted iteratively from oversampled baseband data.

Keywords

Automatic testing; Baseband; Circuit simulation; Circuit testing; Digital signal processing; Power amplifiers; Radio frequency; Radiofrequency amplifiers; Real time systems; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest-Spring, 57th

Conference_Location

Phoenix, AZ, USA

Print_ISBN

0-7803-5686-1

Type

conf

DOI

10.1109/ARFTG.2001.327464

Filename

4120165