• DocumentCode
    1849837
  • Title

    An implication-based method to detect multi-cycle paths in large sequential circuits

  • Author

    Higuchi, Hiroyuki

  • Author_Institution
    Fujitsu Labs. Ltd., Kawasaki, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    164
  • Lastpage
    169
  • Abstract
    This paper proposes a fast multi-cycle path analysis method for large sequential circuits. It determines whether or not all the paths between every flip-flop pair are multi-cycle paths. The proposed method is based on ATPG techniques, especially on implication techniques, to utilize circuit structure and multi-cycle path condition directly. The method also checks whether or not the multi-cycle path may be invalidated by static hazards in combinational logic parts. Experimental results show that our method is much faster than conventional ones
  • Keywords
    automatic test pattern generation; flip-flops; hazards and race conditions; logic testing; sequential circuits; ATPG techniques; circuit structure; combinational logic parts; flip-flop pair; implication-based method; large sequential circuits; multi-cycle paths; path condition; static hazards; Algorithm design and analysis; Automatic test pattern generation; Delay; Explosions; Gas detectors; Hazards; Logic; Permission; Sequential circuits; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings. 39th
  • Conference_Location
    New Orleans, LA
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-461-4
  • Type

    conf

  • DOI
    10.1109/DAC.2002.1012613
  • Filename
    1012613