DocumentCode :
1849837
Title :
An implication-based method to detect multi-cycle paths in large sequential circuits
Author :
Higuchi, Hiroyuki
Author_Institution :
Fujitsu Labs. Ltd., Kawasaki, Japan
fYear :
2002
fDate :
2002
Firstpage :
164
Lastpage :
169
Abstract :
This paper proposes a fast multi-cycle path analysis method for large sequential circuits. It determines whether or not all the paths between every flip-flop pair are multi-cycle paths. The proposed method is based on ATPG techniques, especially on implication techniques, to utilize circuit structure and multi-cycle path condition directly. The method also checks whether or not the multi-cycle path may be invalidated by static hazards in combinational logic parts. Experimental results show that our method is much faster than conventional ones
Keywords :
automatic test pattern generation; flip-flops; hazards and race conditions; logic testing; sequential circuits; ATPG techniques; circuit structure; combinational logic parts; flip-flop pair; implication-based method; large sequential circuits; multi-cycle paths; path condition; static hazards; Algorithm design and analysis; Automatic test pattern generation; Delay; Explosions; Gas detectors; Hazards; Logic; Permission; Sequential circuits; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location :
New Orleans, LA
ISSN :
0738-100X
Print_ISBN :
1-58113-461-4
Type :
conf
DOI :
10.1109/DAC.2002.1012613
Filename :
1012613
Link To Document :
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