DocumentCode
1849837
Title
An implication-based method to detect multi-cycle paths in large sequential circuits
Author
Higuchi, Hiroyuki
Author_Institution
Fujitsu Labs. Ltd., Kawasaki, Japan
fYear
2002
fDate
2002
Firstpage
164
Lastpage
169
Abstract
This paper proposes a fast multi-cycle path analysis method for large sequential circuits. It determines whether or not all the paths between every flip-flop pair are multi-cycle paths. The proposed method is based on ATPG techniques, especially on implication techniques, to utilize circuit structure and multi-cycle path condition directly. The method also checks whether or not the multi-cycle path may be invalidated by static hazards in combinational logic parts. Experimental results show that our method is much faster than conventional ones
Keywords
automatic test pattern generation; flip-flops; hazards and race conditions; logic testing; sequential circuits; ATPG techniques; circuit structure; combinational logic parts; flip-flop pair; implication-based method; large sequential circuits; multi-cycle paths; path condition; static hazards; Algorithm design and analysis; Automatic test pattern generation; Delay; Explosions; Gas detectors; Hazards; Logic; Permission; Sequential circuits; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location
New Orleans, LA
ISSN
0738-100X
Print_ISBN
1-58113-461-4
Type
conf
DOI
10.1109/DAC.2002.1012613
Filename
1012613
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