DocumentCode :
1850033
Title :
Applicability of the enlargement law and the Weibull distribution to the breakdown in SF6
Author :
Finkel, M. ; Boeck, W.
Author_Institution :
Inst. for High Voltage Eng. & Electr. Power Transmission, Tech. Univ. of Munich, Germany
fYear :
2001
fDate :
2001
Firstpage :
436
Lastpage :
440
Abstract :
For insulation co-ordination of gas-insulated transmission lines (GIL), but also for large gas-insulated switchgear (GIS), the question arises, how the reduction of the electrical strength, due to the area effect, has to be taken in to account. From the statistical point of view the enlargement law has to be considered. However, it is very important to apply an adequate basic distribution function. Therefore investigations were undertaken with negative lightning impulse voltage in pure SF6 with one and four cylinder/sphere gaps at gas pressures of 0,3 MPa and 0,5 MPa. The validity of the enlargement law was confirmed. Furthermore the breakdown probability distribution function was calculated with the volume-time-law and it is shown that the measured distribution functions can be matched by the Weibull distribution
Keywords :
SF6 insulation; Weibull distribution; discharges (electric); electric breakdown; gas insulated switchgear; power transmission lines; sparks; 0.3 MPa; 0.5 MPa; SF6; Weibull distribution; area effect; breakdown; distribution function; electrical strength reduction; enlargement law; gas-insulated transmission lines; insulation co-ordination; large gas-insulated switchgear; volume-time-law; Dielectrics and electrical insulation; Distribution functions; Electric breakdown; Gas insulated transmission lines; Gas insulation; Geographic Information Systems; Lightning; Switchgear; Voltage; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
Type :
conf
DOI :
10.1109/CEIDP.2001.963576
Filename :
963576
Link To Document :
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