Modulation transfer function (MTF) analysis for a FLIR system with nonlinear video electronics

Author

Orlando, Harold ; Luu, Thanh

Author_Institution

Div. of Electron. Syst., Northrop Corp., Hawthorne, CA, USA

fYear

1993

fDate

24-28 May 1993

Firstpage

1056

Abstract

The image formation process of forward looking infrared (FLIR) systems differs from system to system with some systems utilizing gamma correction in the electronics. This is done to compensate for display nonlinearity referred to as the display gamma. Automated minimum resolvable temperature (MRT) testing for an automated support system requires modulation transfer function (MTF) measurement data collected at the video output. To compute the MTF the time averaged edge trace is differentiated digitally to produce the line spread function (LSF) and the FFT. The gamma correction introduced in the video signal for display purposes may introduce errors in the MTF measurement and should be removed for a more accurate result. These nonlinear effects are investigated using simulations and actual measurement data from a FLIR system. The results from the analysis provide one with data for designing improved testing procedures

Keywords

automatic testing; digital simulation; electronic engineering computing; electronic equipment testing; fast Fourier transforms; image processing; image sensors; infrared detectors; measurement errors; optical transfer function; optical variables measurement; FFT; FLIR; MTF; automated support system; display gamma; display nonlinearity; errors; forward looking infrared systems; gamma correction; image formation process; line spread function; minimum resolvable temperature; modulation transfer function; nonlinear effects; nonlinear video electronics; simulation; video signal; Automatic testing; Data analysis; Displays; Error correction; Infrared imaging; Signal resolution; System testing; Temperature; Transfer functions; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National

Conference_Location

Dayton, OH

Print_ISBN

0-7803-1295-3

Type

conf

DOI

10.1109/NAECON.1993.290796

Filename

290796