DocumentCode :
1850239
Title :
Option 4 of MIL-H-38534: a quality management system for building compliant hybrid microcircuits for military use
Author :
Jones, Michael C.
Author_Institution :
Defense Electron. Supply Center, Dayton, OH, USA
fYear :
1993
fDate :
24-28 May 1993
Firstpage :
1034
Abstract :
This paper describes the proposed Option 4 for the amendment of MIL-H-38534, General Specification for Hybrid Microcircuits. This paper explains the philosophy and the methods used by this option which includes the use of design analysis, design of experiments (DOE), and statistical process control (SPC). With this option, these methods may be used by the manufacturer´s Technology Review Board (TRB), a group of representatives from each major function within the hybrid area to eliminate or modify inspections and tests within the manufacturer´s Quality Conformance Inspection (QCI) and screening tests which are performed to a baselined Option 1, 2, or 3 flow. This paper explains why a manufacturer would want to implement this option and what benefits the customer will get. The manufacturer would want to get involved so that they can eliminate tests that, for their particular process and conditions, are not value-added processes. These eliminations and modifications should be seen by the customer as reduced prices for compliant hybrids, a quicker turn-around time for compliant new technology hybrids, and increased quality due to decreased handling
Keywords :
economics; hybrid integrated circuits; integrated circuit manufacture; military equipment; military standards; production testing; quality control; MIL-H-38534; Quality Conformance Inspection; compliant hybrid microcircuits; economics; military equipment; prices; quality management; Buildings; Hybrid integrated circuits; Inspection; Manufacturing processes; Performance evaluation; Process control; Pulp manufacturing; Quality management; Testing; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
Type :
conf
DOI :
10.1109/NAECON.1993.290801
Filename :
290801
Link To Document :
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