Title :
The DESC field failure evaluation program “a cradle to grave approach”
Author :
Lantz, Bradley A. ; McNicholl, Brian P.
Author_Institution :
Defense Electron. Supply Center, Dayton, OH, USA
Abstract :
This paper describes the Defense Electronics Supply Center´s field failure evaluation program and the results achieved. The primary objective of the program is to take positive corrective action steps to assure that quality electronics parts are used in DoD weapon systems. The corrective action steps start with the validation of field failures through lab testing. Lab testing is vital in developing quantitative data and determining whether a failure is user induced or supplier related. This can be accomplished with a full compliment of testing capabilities which include electrical, physical and environmental analysis. The process flow of field failures is described from their inception to final corrective action. To illustrate this, four case studies are presented in which Lab testing and coordination with the supplier has resulted in positive corrective action thus improving the quality and reliability of the electronic components in DoD Weapon Systems
Keywords :
electronic equipment testing; failure analysis; military equipment; quality control; reliability; test facilities; weapons; DESC field failure evaluation program; Defense Electronics Supply Center; DoD weapon systems; corrective action; dynamic microphone; lab testing; lighting switch; process flow; quality electronics; twin unit beam power amplifier electron tube; variable air dielectric capacitors; Failure analysis; Feedback loop; Government; Management training; Manufacturing; Personnel; Quality assurance; Test facilities; Testing; Weapons;
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
DOI :
10.1109/NAECON.1993.290802