• DocumentCode
    1850378
  • Title

    B-2 automatic test equipment

  • Author

    Carleton, David L.

  • Author_Institution
    B-2 Div., Northrop Corp., Pico Rivera, CA, USA
  • fYear
    1993
  • fDate
    24-28 May 1993
  • Firstpage
    1003
  • Abstract
    This paper describes the development of automatic test equipment (ATE) to demonstrate an intermediate level maintenance capability for selected avionics for the B-2 Advanced Technology Bomber (ATB). The topics discussed include: the contractual requirements for B-2 ATE; the ATE development concept and approach; the building block approach; the history of B-2 Automatic Test Station (ATS); Test Program Set (TPS) development; design team approach to design maintainability into the avionics; the application of ATE concepts originally planned for the F-20 Tigershark; the application of the USAF Modular Automatic Test Equipment (MATE) requirements for both hardware and software; the use of B-2 ATE for factory acceptance of selected avionics; the participation of the TPS industry in grouping of TPS´s into common lots for development; and the creation of a Central TPS Integration Facility (CTIF) to reduce costs. The current status of the B-2 ATE program is described. Several significant lessons learned (both technical and programmatic) since initiating the B-2 ATE program which have lowered technical risk and reduced program costs, are discussed
  • Keywords
    aircraft instrumentation; automatic test equipment; automatic testing; maintenance engineering; military equipment; Automatic Test Station; B-2 ATE; B-2 automatic test equipment; Central TPS Integration Facility; MATE; Test Program Set; USAF Modular Automatic Test Equipment; bomber; costs; design maintainability; factory acceptance; intermediate level maintenance; military aircraft; Aerospace electronics; Application software; Automatic test equipment; Automatic testing; Costs; Hardware; History; Production facilities; Software maintenance; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-1295-3
  • Type

    conf

  • DOI
    10.1109/NAECON.1993.290806
  • Filename
    290806