Title :
Mission relevant testing
Author :
Lopez, Marc ; Horman, Mel ; Luu, Thanh ; Orlando, Harold
Author_Institution :
Northrop Corp., Hawthorne, CA, USA
Abstract :
A methodology for determining test criteria based on specific mission requirements has been developed which allows greater flexibility in setting pass/fail criteria for automated testing. The rationale for the introduction of mission relevant testing is given along with an illustrative example of its use. The example shows how mission relevant testing can be useful in providing pass/fail criteria which maximizes the utility of sensor systems in specific missions
Keywords :
automatic test equipment; automatic testing; maintenance engineering; military systems; weapons; FLIR; automated testing; flexibility; minimum resolvable temperature function; mission relevant testing; mission requirements; pass/fail criteria; sensors; targets; test criteria; threats; weapon system maintenance; weather; Aerospace electronics; Automatic testing; Electronic equipment testing; Infrared detectors; Personnel; Production facilities; Signal processing algorithms; System testing; Target recognition; Weapons;
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
DOI :
10.1109/NAECON.1993.290809
