Title :
Wideband Frequency-Domain Characterization of High-Impedance Probes
Author :
Arz, Uwe ; Reader, Howard C. ; Kabos, Pavel ; Williams, Dylan F.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA, Phone: [+1] 303.497.4254 Fax: [+1] 303.497.3970 E-mail: uarz@boulder.nist.gov
Abstract :
We investigated the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.
Keywords :
Calibration; Coplanar waveguides; Digital circuits; Electric variables; Fixtures; Frequency measurement; Integrated circuit measurements; Probes; Scattering parameters; Wideband;
Conference_Titel :
ARFTG Conference Digest-Fall, 58th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2001.327491
