Title :
A complete measurement Test-Set for non-linear device characterization
Author :
Ferrero, Andrea ; Teppati, Valeria
Author_Institution :
Dipartimento di Elettronica, Politecnico di Torino, Corso Duca degli Abruzzi, 24, 10129 Torino, Italy, Tel. +39-11-564 4082. Fax +39-11-564 4099. E-mail: ferrero@polito.it
Abstract :
A novel test set which integrates an active load pull system with a VNA and a Time Domain receiver is presented. The system has both time and frequency domain measurement capability coupled with a complete configurable load/source control at fundamental and harmonic frequencies. The test set features along with its calibration and some measurement data in Time and Frequency Domain are presented.
Keywords :
Arm; Calibration; Frequency measurement; Harmonic analysis; Monitoring; Phase measurement; System testing; Time domain analysis; Time measurement; Velocity measurement;
Conference_Titel :
ARFTG Conference Digest-Fall, 58th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.2001.327494
