Title :
Reducing Features to Improve Bug Prediction
Author :
Shivaji, Shivkumar ; Whitehead, E. James ; Akella, Ram ; Kim, Sunghun
Author_Institution :
Univ. of California Santa Cruz, Santa Cruz, CA, USA
Abstract :
Recently, machine learning classifiers have emerged as a way to predict the existence of a bug in a change made to a source code file. The classifier is first trained on software history data, and then used to predict bugs. Two drawbacks of existing classifier-based bug prediction are potentially insufficient accuracy for practical use, and use of a large number of features. These large numbers of features adversely impact scalability and accuracy of the approach. This paper proposes a feature selection technique applicable to classification-based bug prediction. This technique is applied to predict bugs in software changes, and performance of Naive Bayes and Support Vector Machine (SVM) classifiers is characterized.
Keywords :
Bayes methods; learning (artificial intelligence); program debugging; source coding; support vector machines; Naive Bayes; SVM classifiers; Support Vector Machine; classification-based bug prediction; feature selection technique; insufficient accuracy; machine learning classifiers; scalability; software history data; source code file; Computer bugs; Design engineering; History; Machine learning; Prediction algorithms; Scalability; Software engineering; Software performance; Support vector machine classification; Support vector machines; Bug prediction; Feature Selection; Machine Learning; Reliability;
Conference_Titel :
Automated Software Engineering, 2009. ASE '09. 24th IEEE/ACM International Conference on
Conference_Location :
Auckland
Print_ISBN :
978-1-4244-5259-0
Electronic_ISBN :
1938-4300
DOI :
10.1109/ASE.2009.76