Title :
Internal-node waveform probing of MMIC power amplifiers
Author :
Wei, C.J. ; Tkachenko, Y.A. ; Hwang, J.C.M. ; Smith, K.E. ; Peake, A.H.
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Abstract :
A novel internal-node waveform probing technique has been demonstrated on a MMIC. The error of the measurement and its perturbance to circuit operation was estimated and verified to be less than 20%. Valuable insight was obtained from the variation of waveforms as a function of frequency, drive and location.<>
Keywords :
MMIC power amplifiers; integrated circuit measurement; microwave measurement; waveform analysis; MMIC power amplifiers; circuit operation; internal-node waveform probing; measurement error; Calibration; Current measurement; Fingers; Integrated circuit measurements; MMICs; Power amplifiers; Power measurement; Probes; Transmission line measurements; Voltage;
Conference_Titel :
Microwave and Millimeter-Wave Monolithic Circuits Symposium, 1995. Digest of Papers., IEEE 1995
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2590-7
DOI :
10.1109/MCS.1995.470975
