Title :
Measurement of Na and I recoil discrimination and detection efficiency in a cooled “UVIS” NaI detector for dark matter searches
Author :
Spooner, N.J.C. ; Davies, G.J. ; Lally, C.H. ; Smith, N.J.T. ; Smith, P.F. ; Lewin, J.D. ; Squier, G.T.A. ; Jagpal, P.
Author_Institution :
Dept. of Phys., Sheffield Univ., UK
Abstract :
The UVIS dark matter detector, proposed by Spooner and Smith (Phys. Lett. B314 (1993) p 430), consists of <1000 ppm Tl doped NaI scintillator operated at 100-200 K, with measurement of UV and visible scintillation components used to discriminate between electrons (gammas) and Na or I recoils. Presented here are results of measurements of the gamma/nuclear recoil discrimination power of a Kyropolous NaI(0.5 ppm Tl) UVIS test detector operated at 160 K, with monoenergetic neutrons used to induce nuclear recoils via elastic scattering. A parameter Cm, defined to quantify the discrimination capability was measured as a function of photoelectron pulse height. At 40 photoelectrons Cm was found to be 0.5 (corresponding to 90% rejection of gammas with 20% loss of neutron events). The scintillation efficiency for Na and I recoils relative to electrons was also measured at 160 K and found to be 35+/-5% for sodium recoils and 10+/-2% for iodine
Keywords :
dark matter; electron detection; gamma-ray detection; solid scintillation detectors; 100 to 200 K; I recoil discrimination; Na recoil discrimination; Tl doped NaI scintillator; UV; UVIS dark matter detector; cooled UVIS NaI detector; dark matter searches; detection efficiency; elastic scattering; gamma rejection; monoenergetic neutrons; photoelectron pulse height; scintillation efficiency; visible scintillation components; Electrons; Gamma ray detection; Gamma ray detectors; Neutrons; Nuclear measurements; Power measurement; Pulse measurements; Scattering; Solid scintillation detectors; Testing;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
DOI :
10.1109/NSSMIC.1995.504220