Title :
Using IEEE standard 1057 for testing analog-to-digital converters
Author :
Crawley, H.B. ; McKay, R. ; Meyer, W.T. ; Rosenberg, E.I. ; Thomas, W.D.
Author_Institution :
Dept. of Phys. & Astron., Iowa State Univ., Ames, IA, USA
Abstract :
We have used IEEE Trial Use Standard 1057 since 1989 for testing and evaluating analog-to-digital converters for use in high energy physics experiments. This standard primarily covers waveform digitizers, such as digital oscilloscopes, but much of it is applicable to testing ADCs. Using DC levels and sine, triangle, and specialized waveforms, we measure parameters such as integral and differential nonlinearity, number of effective bits, word error rate, short term settling time, and overvoltage recovery. We summarize the tests performed and describe our experience in using the standard
Keywords :
IEEE standards; analogue-digital conversion; nuclear electronics; DC levels; IEEE standard 1057; analog-to-digital converter testing; differential nonlinearity; digital oscilloscopes; effective bits; high energy physics experiments; integral nonlinearity; overvoltage recovery; short term settling time; sine waveforms; specialized waveforms; triangle waveforms; waveform digitizers; word error rate; Analog-digital conversion; Astronomy; Extraterrestrial measurements; Laboratories; Linearity; Manufacturing; Physics; Signal generators; Software testing; Time measurement;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
DOI :
10.1109/NSSMIC.1995.504224