Title :
A subnanosecond high voltage pulser for the investigation of dielectric breakdown
Author :
Mankowski, J. ; Dickens, J. ; Kristiansen, M.
Author_Institution :
Dept. of Electr. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
fDate :
June 29 1997-July 2 1997
Abstract :
A high voltage, sub-nanosecond pulser is designed and built for the purposes of investigating dielectric breakdown. The requirement for the pulser is a voltage pulse of several hundred kilovolts, pulsewidth less than a few nanoseconds, and a risetime <400 psec. This is achieved by using pulse sharpening techniques on the output of a 500 kV Marx bank. Originally designed to stimulate a lightning strike, the voltage waveform from the Marx generator has a slow decay time of tens of /spl mu/sec. In order to obtain a more desirable pulse, the Marx bank is modified. By removing a lumped-element resistor a higher peak output voltage with a faster risetime can be obtained. Circuit simulations have shown the capability of achieving an 800 kV output in less than 40 nsec to a charging (pulse forming) line. The 50 /spl Omega/ impedance, oil-filled, pulse forming line consists of a peaking gap and pulse slicing gap. The peaking gap decreases the risetime of the applied pulse down to about 300 psec. The pulse slicing gap is included to short the voltage applied to the delay line and test chamber.
Keywords :
electric breakdown; power supplies to apparatus; pulse generators; pulsed power technology; 300 ps; 500 kV; 800 kV; Marx bank; delay line; dielectric breakdown; higher peak output voltage; lightning strike stimulation; lumped-element resistor; oil-filled pulse forming line; peaking gap; pulse sharpening techniques; pulse slicing gap; subnanosecond high voltage pulser; test chamber; voltage pulse; Breakdown voltage; Circuit simulation; Delay lines; Dielectric breakdown; Impedance; Lightning; Pulse circuits; Resistors; Space vector pulse width modulation; Testing;
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
DOI :
10.1109/PPC.1997.679394