DocumentCode :
1851272
Title :
C-17A mission computer internal built-in test and I-level fault logging
Author :
Sinaki, George
Author_Institution :
Delco Electron. Corp., Goleta, CA, USA
fYear :
1993
fDate :
24-28 May 1993
Firstpage :
776
Abstract :
This paper describes the C-17A mission computer (MC) internal built-in test (BIT) and intermediate level (I-Level) fault logging strategies. The MC is the primary component of the C-17A mission computer/electronic display subsystem (MC/EDS). The MC/EDS is intended to provide flight management functions for the C-17A aircraft in addition to display processing and display of mission, flight, engine, aircraft status and other related information to the flight crew. The MC is designed to be a highly reliable and fail-safe computer to prevent inadvertent display of hazardously misleading information on the head-up and head-down displays. The MC subsystem uses triple modular redundancy and voting schemes to detect the failures and isolate them to a line replaceable unit (LRU). The fault detection circuits in the MC detect the faults concurrently with the normal operation and report them to the MC CPU. The self-test programs are comprised of separately executing software/firmware modules. These modules when combined with the BIT hardware achieve a high degree of fault detection coverage. In this paper we present the MC internal BIT modes such as power-up, periodic, and initiated BIT. The software BIT mechanisms are discussed and the MC I-level fault logging approach is reviewed
Keywords :
aerospace computer control; aerospace computing; aircraft instrumentation; built-in self test; computerised instrumentation; display instrumentation; fault location; fault tolerant computing; military computing; military equipment; redundancy; BIT; C-17A mission computer; I-level fault logging; built-in test; discrete I/O bit modules; fail-safe computer; failure detection; flight management; head-down displays; head-up displays; memory bit modules; microdiagnostics; power supply bit modules; self-test programs; software/firmware modules; triple modular redundancy; Aerospace electronics; Aircraft propulsion; Built-in self-test; Circuit faults; Computer displays; Electrical fault detection; Engines; Fault detection; Redundancy; Voting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1993. NAECON 1993., Proceedings of the IEEE 1993 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-1295-3
Type :
conf
DOI :
10.1109/NAECON.1993.290843
Filename :
290843
Link To Document :
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