Title :
A statistical aging model for XLPE-insulated medium voltage distribution cables
Author :
McCune, Sandra Luna ; McCune, E. Donice ; Walton, Mark D. ; Smith, John T., III ; Bernstein, Bruce ; Thue, William A. ; Cox, Philip ; Harp, Richard L. ; Rogers, Ed ; Walker, Michael L.
Author_Institution :
Stephen F. Austin State Univ., Nacogodoches, TX, USA
Abstract :
A model has been developed for predicting time-to-failure under mild operating conditions from high multistress conditions. The model presented may be used to calculate the acceleration factors at each condition in an accelerated cable life test matrix. This information is helpful in determining the relationships between the various aging conditions and may allow researchers to select the "optimum" accelerated aging condition for a given cable construction
Keywords :
ageing; XLPE-insulated cables; accelerated cable life test matrix; acceleration factors; aging conditions; cable construction; medium voltage distribution cables; mild operating conditions; multistress conditions; statistical aging model; time-to-failure prediction; Accelerated aging; Cables; Conductors; Laboratories; Land surface temperature; Life estimation; Life testing; Medium voltage; Protocols; Stress;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
0-7803-1950-8
DOI :
10.1109/CEIDP.1994.591805
