A statistical aging model for XLPE-insulated medium voltage distribution cables

Author

McCune, Sandra Luna ; McCune, E. Donice ; Walton, Mark D. ; Smith, John T., III ; Bernstein, Bruce ; Thue, William A. ; Cox, Philip ; Harp, Richard L. ; Rogers, Ed ; Walker, Michael L.

Author_Institution

Stephen F. Austin State Univ., Nacogodoches, TX, USA

fYear

1994

fDate

23-26 Oct 1994

Firstpage

458

Lastpage

470

Abstract

A model has been developed for predicting time-to-failure under mild operating conditions from high multistress conditions. The model presented may be used to calculate the acceleration factors at each condition in an accelerated cable life test matrix. This information is helpful in determining the relationships between the various aging conditions and may allow researchers to select the "optimum" accelerated aging condition for a given cable construction

Keywords

ageing; XLPE-insulated cables; accelerated cable life test matrix; acceleration factors; aging conditions; cable construction; medium voltage distribution cables; mild operating conditions; multistress conditions; statistical aging model; time-to-failure prediction; Accelerated aging; Cables; Conductors; Laboratories; Land surface temperature; Life estimation; Life testing; Medium voltage; Protocols; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation and Dielectric Phenomena, 1994., IEEE 1994 Annual Report., Conference on

Conference_Location

Arlington, TX

Print_ISBN

0-7803-1950-8

Type

conf

DOI

10.1109/CEIDP.1994.591805

Filename

591805