Title :
High dielectric permittivity by ionic space charge polarization in polyethylene oxide
Author :
Kliem, H. ; Wagner, A.
Author_Institution :
Inst. of Electr. Eng. Phys., Saarbrucken Univ., Germany
Abstract :
The nominal static dielectric permittivity of polyethylene oxide can be as high as εr´=150000. The permittivity depends strongly on frequency, humidity absorption, sample thickness, temperature, bias field, and dopant concentration. This behavior is due to an ionic space charge movement with blocking and accumulation of ions at the electrodes. The space charge polarization is modeled in the following way: mobile positive ions fluctuate in a three dimensional multi-well potential by thermal activation. A negative background charge of the same magnitude provides overall charge neutrality. To calculate the local field at each well, the Coulomb interactions between the ions and the image charges in the electrodes are considered. A Monte Carlo simulation yields the experimental results with respect to the investigated parameters. In the time domain a Kohlrausch behavior of the polarization current j~t-1.2 is computed due to the attraction between the ions in the material and their image charges in the electrodes
Keywords :
Monte Carlo methods; dielectric polarisation; humidity; permittivity; polymers; positive ions; secondary cells; solid electrolytes; space charge; time-domain analysis; Kohlrausch behavior; Monte Carlo simulation; bias field; dopant concentration; electrodes; frequency; high dielectric permittivity; humidity absorption; image charges; ionic space charge movement; ionic space charge polarization; polyethylene oxide; positive ions; rechargeable batteries; sample thickness; solid electrolyte; temperature; thermal activation; three dimensional multi-well potential; time domain; Absorption; Dielectrics; Electrodes; Frequency; Humidity; Permittivity; Polarization; Polyethylene; Space charge; Temperature dependence;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2001 Annual Report. Conference on
Conference_Location :
Kitchener, Ont.
Print_ISBN :
0-7803-7053-8
DOI :
10.1109/CEIDP.2001.963627