• DocumentCode
    1851727
  • Title

    A general probabilistic framework for worst case timing analysis

  • Author

    Orshansky, Michael ; Keutzer, Kurt

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    556
  • Lastpage
    561
  • Abstract
    The traditional approach to worst-case static-timing analysis is becoming unacceptably conservative due to an ever-increasing number of circuit and process effects. We propose a fundamentally different framework that aims to significantly improve the accuracy of timing predictions through fully probabilistic analysis of gate and path delays. We describe a bottom-up approach for the construction of joint probability density function of path delays, and present novel analytical and algorithmic methods for finding the full distribution of the maximum of a random path delay space with arbitrary path correlations.
  • Keywords
    circuit CAD; delays; logic CAD; logic gates; probability; timing; arbitrary path correlations; bottom-up approach; circuit effects; gate delays; general probabilistic framework; joint probability density function; path delays; process effects; static-timing analysis; timing predictions; worst case timing analysis; Accuracy; Algorithm design and analysis; Circuit analysis computing; Computer aided software engineering; Delay; Permission; Probability density function; Silicon; Timing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2002. Proceedings. 39th
  • ISSN
    0738-100X
  • Print_ISBN
    1-58113-461-4
  • Type

    conf

  • DOI
    10.1109/DAC.2002.1012687
  • Filename
    1012687