DocumentCode
1851727
Title
A general probabilistic framework for worst case timing analysis
Author
Orshansky, Michael ; Keutzer, Kurt
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear
2002
fDate
2002
Firstpage
556
Lastpage
561
Abstract
The traditional approach to worst-case static-timing analysis is becoming unacceptably conservative due to an ever-increasing number of circuit and process effects. We propose a fundamentally different framework that aims to significantly improve the accuracy of timing predictions through fully probabilistic analysis of gate and path delays. We describe a bottom-up approach for the construction of joint probability density function of path delays, and present novel analytical and algorithmic methods for finding the full distribution of the maximum of a random path delay space with arbitrary path correlations.
Keywords
circuit CAD; delays; logic CAD; logic gates; probability; timing; arbitrary path correlations; bottom-up approach; circuit effects; gate delays; general probabilistic framework; joint probability density function; path delays; process effects; static-timing analysis; timing predictions; worst case timing analysis; Accuracy; Algorithm design and analysis; Circuit analysis computing; Computer aided software engineering; Delay; Permission; Probability density function; Silicon; Timing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2002. Proceedings. 39th
ISSN
0738-100X
Print_ISBN
1-58113-461-4
Type
conf
DOI
10.1109/DAC.2002.1012687
Filename
1012687
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