• DocumentCode
    1851858
  • Title

    Nonlinearity of pulse height of recoil helium in 3He proportional counters

  • Author

    Takeda, Naoto ; Kudo, Katsuhisa

  • Author_Institution
    Electrotech. Lab., Ibaraki, Japan
  • Volume
    1
  • fYear
    1995
  • fDate
    21-28 Oct 1995
  • Firstpage
    400
  • Abstract
    The nonlinearity of the pulse height of recoil helium in 3 He proportional counters were measured, as functions of the operating voltage and the counting gas component. The recoil edge in the pulse height distribution was deviated from the ideal edge position to the lower energy even under the condition of optimized voltage. However, in the same experimental condition, the full energy peak of 3He(n,p)T reaction agreed well to the ideal peak position. This may be concluded that the nonlinear effects, such as an initial recombination and a space charge effect, take place more significantly in the energy loss process of recoil helium, because of its higher LET (linear energy transfer) in the counting gas compared to total of p+T. The deviation of the pulse height of recoil helium becomes larger with increasing of average LET. The experimental results suggested that the nonlinear effects are not avoidable for the higher LET gas, even if the operating voltage is changed in the possible range
  • Keywords
    energy loss of particles; helium-3 counters; proportional counters; space charge; 3He proportional counters; 3He(n,p)T; He; counting gas component; energy loss process; ideal edge position; initial recombination effect; linear energy transfer; nonlinear effects; operating voltage; optimized voltage; pulse height distribution; pulse height nonlinearity; recoil He; recoil edge; space charge effect; Counting circuits; Energy measurement; Energy resolution; Helium; Linearity; Neutrons; Pulse amplifiers; Pulse measurements; Space charge; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-3180-X
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1995.504253
  • Filename
    504253