Title : 
A standardized Method to Automatically Segment Amyloid Plaques in Congo Red Stained Sections from Alzheimer Transgenic Mice
         
        
            Author : 
Teboul, O. ; Feki, A. ; Dubois, A. ; Bozon, B. ; Faure, A. ; Hantraye, P. ; Dhenain, M. ; Delatour, B. ; Delzescaux, T.
         
        
            Author_Institution : 
URA CEA-CNRS, Orsay
         
        
        
        
        
        
            Abstract : 
Automated detection of amyloid plaques (AP) in post mortem brain sections of patients with Alzheimer disease (AD) or in mouse models of the disease is a major issue to improve quantitative, standardized and accurate assessment of neuropathological lesions as well as of their modulation by treatment. We propose a new segmentation method to automatically detect amyloid plaques in Congo Red stained sections based on adaptive thresholds and a dedicated amyloid plaque/tissue modelling. A set of histological sections focusing on anatomical structures was used to validate the method in comparison to expert segmentation.
         
        
            Keywords : 
biological tissues; brain; diseases; image recognition; image segmentation; medical image processing; neurophysiology; Alzheimer disease; Alzheimer transgenic mice; Congo Red stained sections; amyloid plaque modelling; amyloid plaque segmentation; automated detection; mouse models; neuropathological lesions; post mortem brain sections; tissue modelling; Alzheimer´s disease; Animals; Biological materials; Brain modeling; Image analysis; Lesions; Medical treatment; Mice; Pixel; Robustness; Algorithms; Alzheimer Disease; Animals; Artificial Intelligence; Brain; Colorimetry; Congo Red; Contrast Media; Disease Models, Animal; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Mice; Mice, Transgenic; Pattern Recognition, Automated; Plaque, Amyloid; Reproducibility of Results; Sensitivity and Specificity;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
         
        
            Conference_Location : 
Lyon
         
        
        
            Print_ISBN : 
978-1-4244-0787-3
         
        
        
            DOI : 
10.1109/IEMBS.2007.4353614