Title :
A novel laser alignment system for tracking detectors using transparent silicon strip sensors
Author :
Blum, W. ; Kroha, H. ; Widmann, P.
Author_Institution :
Max-Planck-Inst. fur Phys., Munich, Germany
Abstract :
Modern large-area precision tracking detectors require increasing accuracy for the alignment of their components. A novel multi-point laser alignment system has been developed for such applications, in particular for the muon spectrometer of the ATLAS detector at the Large Hadron Collider. The position of the detector components is monitored with respect to reference laser beams with semitransparent optical position sensors at multiple consecutive stations. The custom designed sensors work on the principle of silicon strip photodiodes. Two types of transparent strip sensors, based on crystalline and on amorphous silicon as active material, have been studied. The sensors provide two-dimensional position measurement with order 1 μm resolution uniformly over a wide measurement range of several centimeters. Transmission rates above 90% have been achieved at selected wavelengths produced by laser diodes. This allows to position more than 10 sensors along one laser beam. Custom designed integrated readout electronics is being developed for the sensor systems
Keywords :
counter accessories; detector circuits; laser beam applications; nuclear electronics; silicon radiation detectors; 2D position measurement; ATLAS detector; Large Hadron Collider; Si strip photodiodes; amorphous silicon; component alignment; crystalline Si; integrated readout electronics; large-area precision tracking detectors; laser alignment system; laser diodes; multiple consecutive stations; muon spectrometer; semitransparent optical position sensors; tracking detectors; transmission rates; transparent Si strip sensors; Detectors; Large Hadron Collider; Laser beams; Laser modes; Mesons; Optical beams; Optical sensors; Position measurement; Spectroscopy; Strips;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
DOI :
10.1109/NSSMIC.1995.504268