Title :
Enhancing parametric sensitivity using mode localization in electrically coupled MEMS resonators
Author :
Thiruvenkatanathan, P. ; Yan, J. ; Lee, J.E.-Y. ; Seshia, A.A.
Author_Institution :
Dept. of Eng., Univ. of Cambridge, Cambridge, UK
Abstract :
We use vibration localization as a sensitive means of detecting small perturbations in stiffness in a pair of weakly coupled micromechanical resonators. For the first time, the variation in the eigenstates is studied by electrostatically coupling nearly identical resonators to allow for stronger localization of vibrational energy due to perturbations in stiffness. Eigenstate variations that are orders of magnitude greater than corresponding shifts in resonant frequency for an induced stiffness perturbation are experimentally demonstrated. Such high, voltage-tunable parametric sensitivities together with the added advantage of intrinsic common mode rejection pave the way to a new paradigm of mechanical sensing.
Keywords :
elastic constants; micromechanical resonators; perturbation techniques; eigenstate variations; electrically coupled MEMS resonators; induced stiffness perturbation; intrinsic common mode rejection; mechanical sensing; mode localization; parametric sensitivity; vibration localization; vibrational energy; Couplings; Eigenvalues and eigenfunctions; Micromechanical devices; Physics; Resonant frequency; Springs; Vibrations; Voltage; Mode localization; electrical coupling; parametric sensitivity; resonator;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2009. TRANSDUCERS 2009. International
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-4190-7
Electronic_ISBN :
978-1-4244-4193-8
DOI :
10.1109/SENSOR.2009.5285444