DocumentCode :
1852525
Title :
The analysis of GSM-R redundant network and reliability models on high-speed railway
Author :
Xun, Ding ; Xin, Chen ; Wenyi, Jiang
Author_Institution :
State Key Lab. of Rail, Beijing Jiaotong Univ., Beijing, China
Volume :
2
fYear :
2010
fDate :
1-3 Aug. 2010
Abstract :
As a special digital mobile communication system designed for railway applications, GSM-R can provide voice and data services, as well as the basis of train control system on high-speed railways. Because of the rigid demands of train security, it is important to predict the network reliability of GSM-R network. Therefore, the redundant architecture of GSM-R network is widely used to guarantee its reliability. This paper presents the reliability models of different GSM-R redundant network. By calculating the reliabilities of each reliable model, it is clear that more redundant the architecture is, more reliable the system will be, and the whole system would bear a less failure time per year as the benefit. Meanwhile, as the redundancy of a system raises, its equipments and maintenance will cost much, and the delays in inter-BSC handoff and inter-MSC handoff cannot be ignored. From the standpoint of network hardware equipment and transmission system failure, the reliability of co-sited base station redundant network equals that of intercross base station network, while the viability of intercross base station redundant network is better than co-sited one in natural disasters.
Keywords :
cellular radio; railways; telecommunication network routing; GSM-R redundant network; co-sited base station redundant network; data services; digital mobile communication system; high-speed railway; inter-BSC handoff; inter-MSC handoff; intercross base station network; network hardware equipment; network reliability models; train control system; train security; transmission system failure; voice services; Analytical models; Base stations; Maintenance engineering; Rail transportation; Redundancy; Reliability engineering; Co-sited; GSM-R; Intercross; Redundancy; Reliability model; failure time;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Information Engineering (ICEIE), 2010 International Conference On
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-7679-4
Electronic_ISBN :
978-1-4244-7681-7
Type :
conf
DOI :
10.1109/ICEIE.2010.5559737
Filename :
5559737
Link To Document :
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