DocumentCode :
1852560
Title :
Analysis of radiation damaged HPGe detectors with a new algorithm
Author :
Koenen, M. ; Bruckner, Jonas ; Fabian, U. ; Kruse, H. ; Wanke, H. ; Schroeder, A. ; Starr, R. ; Evans, L.G. ; Trombka, J.I. ; Drake, D.M. ; Englert, P.A.J. ; Dempsey, J.
Author_Institution :
Max-Planck-Inst. fur Chem., Mainz, Germany
Volume :
1
fYear :
1995
fDate :
21-28 Oct 1995
Firstpage :
617
Abstract :
After being irradiated by high energy protons, the energy resolution of HPGe detectors degrade extensively. Resulting line shapes depend mostly on detector geometry and doping type. To improve the analysis of measured gamma-ray spectra of HPGe detectors, new algorithms were developed. Since trapping in radiation damaged HPGe detectors is predominantly hole trapping, the full energy peak is the integration of absorption events produced within the detector at various distances from the positive contact. Implementing that information into fit algorithms, peaks produced by detectors irradiated with 6·108 protons/cm2 could be analyzed. The tailing structure at the low energy side was included in the algorithm. Analog algorithms were successfully applied to damaged coaxial detectors of either doping type. Using these algorithms, it was possible to evaluate transients in damaged detectors after having been exposed to room temperature. Also, the development of tail broadening could be examined
Keywords :
gamma-ray detection; gamma-ray spectrometers; germanium radiation detectors; proton effects; spectral analysis; Ge; absorption events; algorithms; damaged coaxial detectors; detector geometry; doping type; energy resolution; fit algorithm; gamma-ray spectra; high energy protons; hole trapping; line shapes; radiation damaged HPGe detectors; tail broadening; tailing structure; Algorithm design and analysis; Degradation; Doping; Energy resolution; Event detection; Gamma ray detection; Geometry; Protons; Radiation detectors; Shape;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference Record, 1995., 1995 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-3180-X
Type :
conf
DOI :
10.1109/NSSMIC.1995.504283
Filename :
504283
Link To Document :
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