Title :
Embedding infrastructure IP for SOC yield improvement
Author_Institution :
Virage Logic, Fremont, CA, USA
Abstract :
In addition to the functional IP cores, today´s SOC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SOC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This paper analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. It also describes several examples of such embedded IPs for detection, analysis and correction
Keywords :
application specific integrated circuits; design for manufacture; fault tolerance; industrial property; integrated circuit reliability; integrated circuit yield; SOC yield; design phase; fault tolerance; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing susceptibility; reliability; Electronics industry; Fabrication; Fault tolerance; Logic; Manufacturing; Permission; Production; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing;
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location :
New Orleans, LA
Print_ISBN :
1-58113-461-4
DOI :
10.1109/DAC.2002.1012716