DocumentCode :
1852612
Title :
Embedding infrastructure IP for SOC yield improvement
Author :
Zorian, Yervant
Author_Institution :
Virage Logic, Fremont, CA, USA
fYear :
2002
fDate :
2002
Firstpage :
709
Lastpage :
712
Abstract :
In addition to the functional IP cores, today´s SOC necessitates embedding a special family of IP blocks, called infrastructure IP blocks. These are meant to ensure the manufacturability of the SOC and to achieve adequate levels of yield and reliability. The infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This paper analyzes the key trends and challenges resulting in manufacturing susceptibility and field reliability that necessitate the use of such infrastructure IP. It also describes several examples of such embedded IPs for detection, analysis and correction
Keywords :
application specific integrated circuits; design for manufacture; fault tolerance; industrial property; integrated circuit reliability; integrated circuit yield; SOC yield; design phase; fault tolerance; functional IP cores; infrastructure IP blocks; manufacturability; manufacturing susceptibility; reliability; Electronics industry; Fabrication; Fault tolerance; Logic; Manufacturing; Permission; Production; Semiconductor device manufacture; Semiconductor device reliability; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Conference_Location :
New Orleans, LA
ISSN :
0738-100X
Print_ISBN :
1-58113-461-4
Type :
conf
DOI :
10.1109/DAC.2002.1012716
Filename :
1012716
Link To Document :
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