Title :
A Density Based Clustering approach for early detection of fault prone modules
Author :
Sandhu, Parvinder S. ; Kaur, Manpreet ; Kaur, Amandeep
Author_Institution :
Deptt. Of CSE & IT, Rayat & Bahra Inst. of Eng. & Bio-Technol., Mohali, India
Abstract :
Quality of a software component can be measured in terms of fault proneness of data. Quality estimations are made using fault proneness data available from previously developed similar type of projects and the training data consisting of software measurements. To predict fault-proneness of modules different techniques have been proposed which includes statistical methods, machine learning techniques, neural network techniques and clustering techniques. The aim of proposed approach is to investigate that whether metrics available in the early lifecycle (i.e. requirement metrics), metrics available in the late lifecycle (i.e. code metrics) and metrics available in the early lifecycle (i.e. requirement metrics) combined with metrics available in the late lifecycle (i.e. code metrics) can be used to identify fault prone modules by using Density Based Clustering technique. This approach has been tested with real time defect datasets of NASA software projects named as PC1. Predicting faults early in the software life cycle can be used to achieve high software quality. The results show that the fusion of requirement and code metric is the best prediction model for detecting the faults as compared with mostly used code based model.
Keywords :
pattern clustering; software quality; statistical analysis; NASA software projects; density based clustering approach; early detection; fault prone modules; machine learning techniques; neural network techniques; software component; software measurements; statistical methods; Classification algorithms; Clustering algorithms; Complexity theory; Measurement; Predictive models; Probability; Software; Clustering; Defect data; Density Based Clustering; Software Fault; Software Quality;
Conference_Titel :
Electronics and Information Engineering (ICEIE), 2010 International Conference On
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-7679-4
Electronic_ISBN :
978-1-4244-7681-7
DOI :
10.1109/ICEIE.2010.5559753