Title :
2008 international symposium on VLSI design, automation, and test organization
Abstract :
The following topics are dealt with: SoC; IC design; LNA; radio receivers; video systems; DFT; PLL; high-level synthesis; logic synthesis; filters; power dividers; design for testing; error correction; digital circuits; analogue circuits; ADC and IP design.
Keywords :
analogue integrated circuits; design for testability; digital integrated circuits; discrete Fourier transforms; filters; industrial property; integrated circuit design; logic simulation; low noise amplifiers; phase locked loops; radio receivers; system-on-chip; ADC; DFT; IC design; IP design; LNA; PLL; SoC; analogue circuits; design for testing; digital circuits; error correction; high-level synthesis; logic simulation; logic synthesis; power dividers; radio receivers; video systems;
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
DOI :
10.1109/VDAT.2008.4542390
