DocumentCode :
1852942
Title :
Foreword
fYear :
2008
fDate :
23-25 April 2008
Abstract :
Presents the introductory welcome message from the conference proceedings.
Keywords :
Algorithm design and analysis; Automatic testing; CMOS process; CMOS technology; Circuit synthesis; Circuit testing; Design automation; Logic testing; Speech; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
Type :
conf
DOI :
10.1109/VDAT.2008.4542393
Filename :
4542393
Link To Document :
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