Abstract :
Presents the introductory welcome message from the conference proceedings.
Keywords :
Algorithm design and analysis; Automatic testing; CMOS process; CMOS technology; Circuit synthesis; Circuit testing; Design automation; Logic testing; Speech; Very large scale integration;
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
DOI :
10.1109/VDAT.2008.4542393
