DocumentCode
1852962
Title
Table of content
fYear
2008
fDate
23-25 April 2008
Abstract
Presents the table of contents for the proceedings of the 2008 IEEE International Symposium on VLSI Design, Automation and Test (VLSI-DAT).
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location
Hsinchu
Print_ISBN
978-1-4244-1616-5
Type
conf
DOI
10.1109/VDAT.2008.4542394
Filename
4542394
Link To Document