DocumentCode :
1852967
Title :
Effective safety property checking using simulation-based sequential ATPG
Author :
Sheng, Shuo ; Takayama, Koichiro ; Hsiao, Michael S.
Author_Institution :
Dept. of ECE, Rutgers Univ., Piscataway, NJ, USA
fYear :
2002
fDate :
2002
Firstpage :
813
Lastpage :
818
Abstract :
In this paper, we present a successful application of a simulation-based sequential Automatic Test Pattern Generation (ATPG) for safety property verification, with the target on verifying safety property of large, industrial-strength, hardware designs for which current formal methods fail. Several techniques are developed to increase the effectiveness and efficiency during state exploration and justification of the test generator for verification, including (1) incorporation of a small combinational ATPG engine, (2) reset signal masking, (3) threshold-value simulation, and (4) weighted Hamming distance. Experimental results on both ISCAS89 benchmark circuits and real industry circuits have shown that this simulation-based verifier achieves better or comparable results to current state-of-the-art formal verification tools BINGO and CHAFF.
Keywords :
VLSI; automatic test pattern generation; circuit simulation; integrated circuit testing; logic testing; VLSI design; automatic test pattern generation; deterministic ATPG; industrial-strength hardware designs; large hardware designs; reset signal masking; safety property checking; safety property verification; simulation-based sequential ATPG; small combinational ATPG engine; state exploration; threshold-value simulation; weighted Hamming distance; Automatic test pattern generation; Benchmark testing; Circuit simulation; Circuit testing; Engines; Formal verification; Hamming distance; Hardware; Safety; Signal generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
ISSN :
0738-100X
Print_ISBN :
1-58113-461-4
Type :
conf
DOI :
10.1109/DAC.2002.1012734
Filename :
1012734
Link To Document :
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