A simple calibration algorithm for partially leaky model multiport vector network analyzers

Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, unless calibration model and number of standard connections are somehow optimized. In this paper we present an optimized solution for a practical set of multiport problems, where calibration model can be divided in two separate leaky halves, neglecting leakage between them. This problem is typical for multiport on-wafer measurements, where multi-signal probes (e.g. GSGSG) are implied. We show that with a proper choice of calibration standards, the optimized calibration procedure takes the same time of a classical two port LRM or TRL.