Title :
Adapting mechanical models to fit electronics
Author :
Benz, Glan E. ; Bazovsky, Igor, Sr.
Author_Institution :
Teledyne Controls, West Los Angeles, CA, USA
Abstract :
Mechanical reliability models for given age parameters are adapted to provide electronic fatigue life distributions for the mission/test profile of stress amplitudes. This process also provides affordable life test plans. The mechanical renewal model is adapted to provide a replacement for mean time between failures (MTBF) as a design requirement and as a key to support analyses. The discussion of mechanical models and their adaptation to electronics include: a Markov deterioration model and adaptation; a interval reliability model and adaptation; an interval reliability example; and a Markov deterioration example
Keywords :
Markov processes; aerospace; failure analysis; reliability; Markov deterioration model; age parameters; design; electronic fatigue life distributions; failure analysis; interval reliability model; life test; mean time between failures; mechanical models; stress amplitudes; support analyses; Aerospace electronics; Aircraft propulsion; Electronic equipment testing; Equations; Fatigue; Life testing; Predictive models; Stress; Strontium; System testing;
Conference_Titel :
Reliability and Maintainability Symposium, 1990. Proceedings., Annual
Conference_Location :
Los Angeles, CA
DOI :
10.1109/ARMS.1990.67949