Title :
Timed pattern generation for noise-on-delay calculation
Author :
Choi, Seung Hoon ; Dartu, Florentin ; Roy, Kaushik
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
Computing the effects of noise on delay is required for all circuits from simple ASIC designs to microprocessors. Transistor-level simulation engines make accurate delay calculation affordable only if the number of simulation per stage is very small. We propose a solution that predicts the alignment of aggressor signals with respect to the victim signal to induce the worst-case noise effect on delay. The aggressor alignment can be used to setup a detailed simulation. The worst-case delay in the presence of noise is predicted within 5% error for more than 99% of the cases tested using an average of 1.27 simulations per stage transition.
Keywords :
circuit simulation; delay estimation; digital integrated circuits; integrated circuit noise; timing; alignment prediction; delay pull-in; delay push-out; interconnect delay; noise-on-delay calculation; simulation; timed pattern generation; transistor-level simulation; worst-case delay; Application specific integrated circuits; Circuit noise; Circuit simulation; Computational modeling; Delay effects; Engines; Microprocessors; Noise generators; Predictive models; Testing;
Conference_Titel :
Design Automation Conference, 2002. Proceedings. 39th
Print_ISBN :
1-58113-461-4
DOI :
10.1109/DAC.2002.1012744