DocumentCode :
1853229
Title :
Measuring the on wafer noise figure of a W-band LNA - an application
Author :
Burns, John Gregory ; Fudem, Howard ; Murphy, Michael R.
Author_Institution :
Northrop Grumman Corp., Linthicum, MD, USA
fYear :
2005
fDate :
38520
Abstract :
A method to measure the noise figure of a three stage W-band low noise amplifier (LNA) is described. Measurement results of noise figure and s-parameter gains are compared.
Keywords :
MMIC amplifiers; S-parameters; integrated circuit noise; microwave measurement; MMIC; W-band LNA; low noise amplifier; noise figure measurement; s-parameter gain; Equations; Gain measurement; Laboratories; Loss measurement; Low-noise amplifiers; Noise figure; Noise measurement; Probes; Scattering parameters; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN :
0-7803-8858-5
Type :
conf
DOI :
10.1109/ARFTGS.2005.1500566
Filename :
1500566
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1853229
بازگشت