Title :
Built-in jitter measurement methodology for spread-spectrum clock generators
Author :
Hsu, Jenchien ; Chou, Maohsuan ; Su, Chauchin
Author_Institution :
Dept. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu
Abstract :
In this paper, a built-in-self-test methodology for measuring frequency deviation and jitter of spread-spectrum clock generators is presented. It utilizes a phase detector to detect the clock phase of spread spectrum clock (SSC) and then measure the jitter by filtering out the low frequency component of the clock phase. Frequency of spread-spectrum clock can also be obtained by filtering out the high frequency component of the signal. The methodology is analyzed and verified with chip implementation and measurement. As an all digital design, the hardware overhead is very low.
Keywords :
built-in self test; clocks; timing jitter; clock phase; jitter measurement methodology; phase detector; spread-spectrum clock generators; Clocks; Filtering; Frequency measurement; Hardware; Jitter; Phase detection; Phase frequency detector; Phase measurement; Semiconductor device measurement; Spread spectrum communication; Jitter Measurement; Spread-Spectrum Clock; Spread-Spectrum Clock Built-in Self Test;
Conference_Titel :
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1616-5
Electronic_ISBN :
978-1-4244-1617-2
DOI :
10.1109/VDAT.2008.4542414
