• DocumentCode
    1853470
  • Title

    The measurement of the characteristic impedance of transmission lines using nanoscale resistive films

  • Author

    Yip, Jimmy G M ; Lee, M-H John ; Ridler, Nick M. ; Collier, Richard J.

  • Author_Institution
    Nat. Phys. Lab., Teddington, UK
  • fYear
    2005
  • fDate
    38520
  • Abstract
    The value of the characteristic impedance, Z0, is well known for most transmission lines either from mathematical formulations or computer modelling (Wadell, 1991). So much so, that when an impedance, ZL, is evaluated, a value of Z0 is assumed and only a measurement of the reflection coefficient, ρ, is needed. However, there are instances where an experimental value of Z0 is required, for example in the cases of some lines with attenuation or exotic lines where mathematical equations are not available and where computer models are not rigorous. This paper shows that by reversing the procedure described above, a value Z0 can be found from a known value of ZL, and a measurement of ρ. In order to demonstrate the validity of this technique, some well-characterised transmission lines were measured at the National Physical Laboratory (NPL), using nanoscale sheet resistances to give ZL, and the results are given in this paper. The technique can now be extended to examine those instances mentioned above.
  • Keywords
    electric impedance measurement; millimetre wave measurement; transmission lines; characteristic impedance measurement; computer modelling; mathematical equations; mathematical formulations; nanoscale resistive films; nanoscale sheet resistances; reflection coefficient measurement; transmission lines; Dielectric substrates; Dielectric thin films; Electric resistance; Electrical resistance measurement; Equations; Impedance measurement; Laboratories; Transmission line measurements; Transmission line theory; Waveguide discontinuities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest, 2005. Spring 2005. 65th
  • Print_ISBN
    0-7803-8858-5
  • Type

    conf

  • DOI
    10.1109/ARFTGS.2005.1500577
  • Filename
    1500577