DocumentCode
1853470
Title
The measurement of the characteristic impedance of transmission lines using nanoscale resistive films
Author
Yip, Jimmy G M ; Lee, M-H John ; Ridler, Nick M. ; Collier, Richard J.
Author_Institution
Nat. Phys. Lab., Teddington, UK
fYear
2005
fDate
38520
Abstract
The value of the characteristic impedance, Z0, is well known for most transmission lines either from mathematical formulations or computer modelling (Wadell, 1991). So much so, that when an impedance, ZL, is evaluated, a value of Z0 is assumed and only a measurement of the reflection coefficient, ρ, is needed. However, there are instances where an experimental value of Z0 is required, for example in the cases of some lines with attenuation or exotic lines where mathematical equations are not available and where computer models are not rigorous. This paper shows that by reversing the procedure described above, a value Z0 can be found from a known value of ZL, and a measurement of ρ. In order to demonstrate the validity of this technique, some well-characterised transmission lines were measured at the National Physical Laboratory (NPL), using nanoscale sheet resistances to give ZL, and the results are given in this paper. The technique can now be extended to examine those instances mentioned above.
Keywords
electric impedance measurement; millimetre wave measurement; transmission lines; characteristic impedance measurement; computer modelling; mathematical equations; mathematical formulations; nanoscale resistive films; nanoscale sheet resistances; reflection coefficient measurement; transmission lines; Dielectric substrates; Dielectric thin films; Electric resistance; Electrical resistance measurement; Equations; Impedance measurement; Laboratories; Transmission line measurements; Transmission line theory; Waveguide discontinuities;
fLanguage
English
Publisher
ieee
Conference_Titel
ARFTG Conference Digest, 2005. Spring 2005. 65th
Print_ISBN
0-7803-8858-5
Type
conf
DOI
10.1109/ARFTGS.2005.1500577
Filename
1500577
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