DocumentCode
1853529
Title
An improved feature ranking method for diagnosis of systematic timing uncertainty
Author
Bastani, Pouria ; Callegari, Nicholas ; Wang, Li C. ; Abadir, Magdy
Author_Institution
Univ. of California - Santa Barbara, Santa Barbara, CA
fYear
2008
fDate
23-25 April 2008
Firstpage
101
Lastpage
104
Abstract
For diagnosis of systematic modeling uncertainty, an earlier work proposes a path-based methodology that employs support vector classification analysis to rank so-called delay entities. This work explains that delay entities can be seen as path features that are used to encode the characteristics of a path. We present an improved path feature ranking algorithm based on support vector epsiv-insensitive regression. We also discuss how to check if a dataset is too noisy for the analysis. Experimental results are presented to explain the ranking methodology and demonstrate the effectiveness of the improved approach.
Keywords
delays; pattern classification; regression analysis; support vector machines; timing; delay entities; improved feature ranking; path-based methodology; support vector classification analysis; support vector regression; systematic modeling uncertainty; systematic timing uncertainty; uncertainty diagnosis; Automatic test pattern generation; Delay; Predictive models; Robustness; Semiconductor device measurement; Semiconductor device noise; Silicon; Testing; Timing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
Conference_Location
Hsinchu
Print_ISBN
978-1-4244-1616-5
Electronic_ISBN
978-1-4244-1617-2
Type
conf
DOI
10.1109/VDAT.2008.4542422
Filename
4542422
Link To Document