• DocumentCode
    1853529
  • Title

    An improved feature ranking method for diagnosis of systematic timing uncertainty

  • Author

    Bastani, Pouria ; Callegari, Nicholas ; Wang, Li C. ; Abadir, Magdy

  • Author_Institution
    Univ. of California - Santa Barbara, Santa Barbara, CA
  • fYear
    2008
  • fDate
    23-25 April 2008
  • Firstpage
    101
  • Lastpage
    104
  • Abstract
    For diagnosis of systematic modeling uncertainty, an earlier work proposes a path-based methodology that employs support vector classification analysis to rank so-called delay entities. This work explains that delay entities can be seen as path features that are used to encode the characteristics of a path. We present an improved path feature ranking algorithm based on support vector epsiv-insensitive regression. We also discuss how to check if a dataset is too noisy for the analysis. Experimental results are presented to explain the ranking methodology and demonstrate the effectiveness of the improved approach.
  • Keywords
    delays; pattern classification; regression analysis; support vector machines; timing; delay entities; improved feature ranking; path-based methodology; support vector classification analysis; support vector regression; systematic modeling uncertainty; systematic timing uncertainty; uncertainty diagnosis; Automatic test pattern generation; Delay; Predictive models; Robustness; Semiconductor device measurement; Semiconductor device noise; Silicon; Testing; Timing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2008. VLSI-DAT 2008. IEEE International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-1-4244-1616-5
  • Electronic_ISBN
    978-1-4244-1617-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2008.4542422
  • Filename
    4542422